Semiconductor Lifetest Equipment
key details
| Status | complete |
|---|---|
| Category (CPV) | 38000000 |
| Procedure | limited |
| OCID | ocds-h6vhtk-0398be |
Award
| Supplier | Value | Date | Status |
|---|---|---|---|
| Yelo Ltd. | · | · | active |
description
NPL and the University of Glasgow will work together to establish a service for Burn-in and Life-testing of semiconductor laser diodes in high-volume for manufacturers and suppliers of laser diodes.
The requirements for such a system are as follows:
Essential:
| • | TO46, TO3, TO5, TO8, TO9 package compatibility in volumes up to 200 per month for burn-in and 100 devices for life-test per month |
| • | Life-test duration > 10,000 hours |
| • | Burn in / Life-test temperature from Ambient to 150degC with independent heaters in each module |
| • | Maximum bias up to 1A on TO3 and TO8 package, and Chip-on-carrier (CoC) |
| • | Bar test – Typical bar with dimensions 30 mm long and up to 10 mm wide, with 100 devices across. All the devices on the bar will require burn-in. At least 10 devices on each bar will need life-test. |
| • | Optical detector to monitor light output of each device under test |
| • | Wavelength range from 400 nm – 1600 nm |
| • | Temperature sensor at each device for close monitoring |
| • | Independent current drive for each device |
| • | Adaptable/re-configurable bar-test, CoC layout and # of pins on TO-packages for future “non-standard” testing requests |
| • | Low noise, highly stable current driver for each device (<0.1mA RMS noise) |
| • | Stable temperature during life-test (no variation > 1degC) |
| • | Remote access to monitor and control system software |
notice history
1 notice published against this procurement.
| Published | Type | Regime | Notice |
|---|---|---|---|
| 19 Jan 2023 | Voluntary ex-ante transparency (F15) | Earlier regulations | 001637-2023 |
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source
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