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Ion Beam Facility

THE UNIVERSITY OF SHEFFIELD Published 18 Nov 2016 Contracts Finder

key details

Statuscomplete
Category (CPV) 38510000
RegionYorkshire and the Humber
Deadline9 Jun 2015
Contract start25 Sept 2015
Contract end31 Mar 2016
Procedureopen
SME suitableNo
OCIDocds-b5fd17-ed7a4b2b-adc8-11e6-9901-0019b9f3037b

Awards (3)

This procurement was awarded to 3 suppliers. Values shown are per-award; the notice total is ·.

SupplierValueDateStatus
FEI UK Ltd shared £0 24 Sept 2015 active
Quorum Technologies Ltd shared £0 24 Sept 2015 active
Oxford Instruments NanoAnalysis shared £0 24 Sept 2015 active

description

This contract is a one-off supply only and has now been awarded. Dual Beam Focused Ion Beam –Scanning Electron Microscope instrument. The instrument will be used for the investigation of a wide range of materials, including polymers, metals, ceramics, glasses, composites, semiconductors, nanomaterials, nanostructures and coatings.

For the purposes of this procurement our requirements have been divided into 3 lots as follows:-

Lot 1 – Focused Ion Beam Scanning Electron Microscope (FIB SEM) system.

Lot 2 – Cooling system for FIB SEM.

Lot 3 – Energy Dispersive spectroscopy system for FIB SEM.

Additional information: This contract is for a one-off supply of scientific equipment, including warranty and service contracts for 3 or more years.

notice history

1 notice published against this procurement.

PublishedTypeRegimeNotice
26 Oct 2015 Award (award) · ocds-b5fd17-ed7a4b2b-adc8-11e6-9901-0019b9f3037b-77951-200-ye

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