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RFQ - Profilometer for sputter crater depth measurement

National Physical Laboratory Published 18 Sept 2024 Contracts Finder

key details

Statusactive
Category (CPV) 38000000
Deadline9 Oct 2024
Contract start31 Oct 2024
Contract end9 Oct 2025
Procedurelimited
SME suitableYes
OCIDocds-b5fd17-e9cb1cfe-1d0c-4127-9968-94cce826a843

description

NPL requires a stylus profilometer to measure the sputter crater depth for X-ray Photoelectron spectroscopy and secondary ion mass spectrometry metrology work. Sputter craters are typically in the range of (1000 µm x 1000 µm) to (100 µm x 100 µm) and with depths from 10 µm to 100 nm. The sample often has high reflectivity (e.g. silver thin film or silicon wafer) and so a stylus profilometer rather than an optical profilometer is required.

Detailed specifications are provided in section 2.2 and 2.3. In addition to these, high quality profiles will be deemed to have the least spurious spikes or ripples. The capability for automation and a 3D scan is preferred.

Additional information:

The Authority is using the LUPC Bravo e-tender portal to conduct the procurement process. All Bidders must register their company via the LUPC Bravo Portal. This can be done via the following link https://lupc.bravosolution.co.uk/web/login.shtml

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notice history

1 notice published against this procurement.

PublishedTypeRegimeNotice
18 Sept 2024 Tender (tender) · ec270fc7-1d46-4e92-bcb1-6291a46c4e01-786446

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