High-Voltage Semiconductor Probing System and Parameter Analyser System - AWARD

The University of Warwick has a requirement to update its high voltage characterisation facility comprising a parameter analyser and probe station (prober). The combined facility will be capable of making current-voltage (I-V) and capacitance-voltage (C-V) measurements on power semiconductor devices made in house, both on-wafer (or on-chip) through the use of the prober, and packaged.

This tender is split into two separate lots;

• oLot 1 - High-Voltage Semiconductor Probing System (Prober)
• oLot 2 - High-Voltage Parameter Analyser System

In order to express interest in this opportunity please go to the University of Warwick In-Tend supplier portal (https://in-tendhost.co.uk/universityofwarwick).

The University of Warwick is not a contracting authority for the purposes of the Public Contracts Regulations 2015 (as amended) and its procurement activities are not subject to the Public Contracts Regulations 2015 or the obligations under the European Public Procurement Directives, including the European Remedies Directive. Advertisement of any contract in the Official Journal of the European Union or Contracts Finder is at the sole discretion of the University and is undertaken on a voluntary basis with no implied obligation to comply with the procurement legislation.

Please note the tender deadline for the tender is 12pm on 24th August 2017.